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ABOUT US / Robb Jones


Sr. Test Scientist
Phone: 805-708-2717



M.S., University of Colorado, Electrical and Computer Engineering, 1987
B.A., Carleton College, Physics major, Mathematics minor, 1984


Product Support Engineering Staff (FPA Test), Lockheed Martin Santa Barbara
Focalplane, 1994-2023.

Worked on various aspects of infrared sensor testing, from ROIC wafer-probe (production as
well as design-verification testing), FPA production screen-testing, and (limited experience)
integrated dewar testing. Evaluated and performed trend-analysis on FPA test data, with special
emphasis on providing meaningful, near real-time feedback to FPA manufacturing, for yield and
performance improvement. Developed and built test equipment, including LN pour-filled
cryogenic test dewars, test-stations, wafer-probe equipment, and specialized equipment, such
as thermal-cycle, MTF, imaging, and device characterization. Built, maintained, and ran fleet of
large closed-cycle test dewars for long-wave FPA testing at lower-than-LN temperatures, for
IRST MCT and long-wave nBn testing.

Research Scientist, Lockheed Palo Alto Research Laboratories (now Lockheed Martin
Advanced Technology Center), 1987-1993.
Worked on end-to-end testbeds for large, space-based infrared sensor systems, developing,
building, and testing various infrared image-generation devices. This involved mid-wave, long-
wave, and very long-wave sensors. Ran referee comparison testing (low-background radiometry
and MTF measurements) for large-TDI CCD scanning arrays from several competing vendors.
This included building and calibrating test equipment, including the imager for scanning MTF
testing, running the tests, and compiling and presenting results. This also included stress testing
and modeling of impact on in-scan MTF of varying mismatch of imaging and CCD scan rates,
for varying numbers in TDI. Ran comparison testing of FPAs from 5 different candidate vendors
for THAAD program. This included measurements of relative impact on correctability of
fractional-degree detector temperature variation.

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